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PCN number
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37-2018 December 2018 Performance Limitation Process Change AS3956
DR CN 01 November 2018 Change of final device test location/product label Process Change please refer to product list
34-2018 November 2018 Performance limitation AS3955A Process Change AS3955A
25-2018 July 2018 Second site for backend final testing Process Change AS5510-DWLx
DR PCR 04 July 2018 Change of final device test location Process Change pls. refer to product list
23-2018 July 2018 Exchange of pretreatment chemistry Process Change TSL2584TSV
25-2018 July 2018 Second site for backend final testing Process Change AS3956-ATWx
13-2018 May 2018 New Wafer Sort Test Facility Process Change AS5132
13-2018 May 2018 New Wafer Sort Test Facility Process Change AS5162
13-2018 May 2018 New Wafer Sort Test Facility Process Change AS5262
13-2018 May 2018 New Wafer Sort Test Facility Process Change AS5600
13-2018 May 2018 New Wafer Sort Test Facility Process Change AS5601
NanEye-PCR-11 May 2018 Supply Chain Update Process Change NE2D_CHIP_B&W_SGA CON / NE2D_CHIP_RGB_SGA CON
14-2018 Apr 2018 Datasheet change Process Change TCS3430
08-2018 Mar 2018 Burn in product transfer Process Change AS5145B, AS5403E, AS8223
09-2018 Mar 2018 Filter Equipment Change Process Change TSL2584TSV
09-2018 Mar 2018, April 2018 Filter Equipment Change Process Change TSL2584TSV, AS7000
10-2018 (Dragstar-PCR-03) Mar 2018 Glass cover tape Process Change Pls refer to notification
05-2018 Feb 2018 NanEye2D Supply Chain update Process Change Pls refer to notification
01-2018 Jan 2018 Test location move - Test platform transfer Process Change ENS210
Dragster PCR-02 Oct 2017 LCC Serial number Laser printing Process Change Process Change
Dragster PCR-01 Oct 2017 Black mask change Process Change Dragster products
PCR-07 Sep 2017 Naneye-new cable supplier Process Change Naneye products
20-2017 Jun 2017 PCB upgrade Process Change Pls refer to notification
05-2017 Apr 2017 Change of metal plating Process Change TSL1412S, TSL1406R, TSL1406RS (addendum to EoL notification)
16-2017 Apr 2017 2nd source of wafer fabrication Process Change AS5600
16-2017 Apr 2017/Dec 2017 2nd source of wafer fabrication Process Change AS5600/AS3435, AS3415
16A-2017 Apr 2017 2nd source of wafer fabrication Process Change AS5162
08-2017 Feb 2017 Assembly House Change Process Change PCAP01AD
21-2016 Nov 2016 MOQ number on reel increased Change CCS801B, CCS811B, CCS803A
24-2016 Oct 2016 Performance improvement Redesign AS3955
18-2016 Aug 2016 Leadframe change Process Change Pls refer to notification
17-2016 Jul 2016 Terminal plating and Saw type of QFN Process Change TDC-GP2
11-2016 May 2016 Redesign AS3701x Redesign Pls refer to notification
11-2015 Jan 2016 WLCSP Product Transfer from Flipchip Int. to DECA Technologies Process Change Pls refer to notification
PCN01-2014 Feb 2015 MLF Assy Site Transfer_Amkor Change Pls refer to notification
31-2014 Jan 2015 Second source of wafer fabrication Process Change AS3911B-AQFx / AS3415-EQFx / AS3435-EQFx / AS3415-35-ESWB
PCN38-2018 December 2018 Change of Polyimide Wafer Coating Material used in our Fab B Process Change AS5900
PCN05A-2018 (NanEye-PCR-08A) October 2018 NanEye2D Supply Chain Update Progress Change NanEye SD products

Asset Publisher

CN number
Date of issue
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24-2018 August 2018 New wafer inking tool Customer information AS2522BF SD F, AS2524F SD F, AS5040 SD Fx, SL900A-ASDF SD F
18-2018 May 2018 updated CCS811 datasheet customer information CCS811B
15-2018 May 2018 change to the recommended application circuit and MOX software libaries for CCS801 customer information CCS801B
11-2018 April 2018 test diode pads unbonding customer information CHR70M
11-2018 April 2018 test diode pads unbonding customer information CMV12000
11-2018 April 2018 test diode pads unbonding customer information CMV2000
11-2018 April 2018 test diode pads unbonding customer information CMV20000
11-2018 April 2018 test diode pads unbonding customer information CMV4000
02-2018 Mar 2018 Change of firmware application Customer information CCS811B
03-2018 Feb 2018 Change notification for ENS210 datasheet Customer information ENS210
06-2018 Feb 2018 Marking change Customer information TMD2725x
25-2017 Oct 2017 Updates to CCS811 Datasheet Customer information CCS811B
18-2017 Aug 2017 PTSM sensors - new shrink tube Customer information Pls refer to notification
13-2017 Mar 2017 MOQ amendment Customer information Pls refer to notification
05-2017 Mar 2017 Change of trace code marking Customer information CCS801, CCS811
01-2017 Jan 2017 Datasheet Change Customer Information CCS801B
26-2016 Dec 2016 Datasheet Change Customer Information AS5043A/D/E
15-2016 Jun 2016 Label change (TSL26721FN and TMD27723) Customer Information Pls refer to notification